IMI M7200 SD/MMC/CF Engineering Tester

IMI M7200 SD/MMC/CF Engineering Tester

IMI International Microsystems Incorporated

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CF-SD-MMC Engineering Tester

The M7200 is an Engineering Production Tester for Flash devices such as IDE ATA SSD’s, Compact Flash Cards, SD Cards, and Linear Flash Cards. The modular construction allows support of various device types with removable modules. Each M7200 can hold up to two modules and thus the maximum capacity is either 8 or 16 devices depending upon the number of sockets per module.

CF-SD-MMC Testing Functions:

  • Fast parallel tester executing tests which are made using a powerful yet easily understood GUI (Graphical User Interface)
  • Test scripts are stored either on a resident high capacity removable hard drive or on a connected network server.
  • DC parametric leakage testing
  • ICC measurement
  • VCC margining
  • Write/read speed testing
  • User defined mode and command testing

Initial Production of Flash devices invariably requires low level formatting and possible special hardware interfacing. The modular structure of the M7100 hardware and software has allowed the M7200 to successfully perform low level formatting and testing to a wide variety of Flash devices including SD cards, CF cards, IDE single chip PATA devices, linear Flash memory devices, etc.

The M7200 runs under a full featured Linux operating system with a 17" LCD, PC keyboard, and mouse. Network interface is through 10/100 Ethernet connection.

A complimentary bench top production tester, the M7100 Bench Top Production Tester is available which holds up to eight of the M7200 adapters and provides up to 32 or 64 device test sockets depending up the modules used. The M7200 and the M7100 share identical hardware and software capabilities allowing development and testing of test scripts on the M7200 to be used directly on the M7100 without modification.


Feature SD MMC CF
Full Linux Operating System x x x
Parametric Tests - Leakage To Ground, Leakage To Vcc, Cross Leakage, Open Pin x x x
Functional Tests - Read/Write/Verify x x x
Standby Icc Measurement x x x
Read/Write Speed Test x x x
Low Level Controller Initialization/Firmware Download(1) x x x
Base Unit Supports 4-8 sockets     x
Base Unit Supports 8-16 Sockets x x  
Removable System Drive x x x
Independent Power Supply For Test Modules x x x
Parallel Testing.  Most Tests Can Be Done In Parallel x x x
GUI Allows Selection, Build and Edit of JOB Functions x x x
Terminal Console For Inputting Commands x x x
Supports TCL Scripting x x x
Can Implement Vendor Specific Commands x x x
Burn-In Test (Continuous Loop) x x x
Duplication From A Binary Image x x x
Easily Removable Test Module x x x

Supports All CF Modes - Memory Map, I/O Map,True IDE,DMA and UDMA

Supports Type I and Type II CF

Supports IDE Flash Module

Supports IDE Drive

Vcc Margin Testing (+/- 10%) on the 3.3V and 5.0V rail

Verify IDDrive Information

Supports Custom IDE/ATA Device Using Custom Adapter

Supports LBA48 Addressing


Supports SD2.0 (SDHC) x  
Supports MMC 4.2   x
Adjustable SD/MMC Clock x x
Vcc Margin Testing (+/- 10%) on the 3.3V rail x x

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